PPEPPD - International Conference on Properties and Phase Equilibria for Product and Process Design
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PPEPPD - International Conference on Properties and Phase Equilibria for Product and Process Design
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Poster title
Revealing the essence of large-error slip measured by atomic force microscopy (AFM) from resistance (R) analysis
Poster code
P 13.12
Authors
Zehui Liu
Nanjing Tech University
Presenter
Liwen Mu
Nanjing Tech University
Xiaohua Lu
Nanjing Tech University
Form of presentation
Poster
Topics
Electrolytes