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Poster title Atomic-Scale Detection of Surface Defects in CuInS₂ Quantum Dots Using Advanced (S)TEM Imaging and Multislice Simulations
Poster code P 1.07
Authors
  1. Albert Elias Tronholm Edvardsen Danmarks Tekniske Universitet / Technical University of Denmark Presenter
  2. Joerg R. Jinschek Technical University of Denmark
Form of presentation Poster
Topics
  • 1) Characterization Methods