Autor:innen:
Cornelius Wendt | Leibniz University Hannover, Institute of Electrical Engineering and Measurement Technology | Germany
Dr.-Ing. Erik Bunert | Leibniz University Hannover, Institute of Electrical Engineering and Measurement Technology | Germany
Michael Bachmann | KETEK GmbH | Germany
Felix Düsberg | KETEK GmbH | Germany
Simon Edler | KETEK GmbH | Germany
Christoph Langer | KETEK GmbH | Germany
Robert Ławrowski | OTH Regensburg, Faculty of General Sciences and Microsystems Technology | Germany
Matthias Hausladen | OTH Regensburg, Faculty of General Sciences and Microsystems Technology | Germany
Rupert Schreiner | OTH Regensburg, Faculty of General Sciences and Microsystems Technology | Germany
Prof. Dr. Stefan Zimmermann | Leibniz University Hannover, Institute of Electrical Engineering and Measurement Technology | Germany